A Structural Investigation of CdTe(001) Thin Films on GaAs/Si(001) Substrates by High-Resolution Electron Microscopy-Reference-Cited by-同舟云学术

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A Structural Investigation of CdTe(001) Thin Films on GaAs/Si(001) Substrates by High-Resolution Electron Microscopy

Published:2012-02-24 Issue:10 Volume:41 Page:2795-2798
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Kim Kwang-Chon,Baek Seung Hyub,Kim Hyun Jae,Song Jin Dong,Kim Jin-Sang

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-012-1991-z.pdf

Reference13 articles.

1. Y.P. Chen, S. Sivananthan, and J.P. Faurie, J. Electron. Mater. 22, 951 (1993).

2. K.-C. Kim, H.J. Kim, S.-H. Suh, M. Carmody, S. Sivananthan, and J.-S. Kim, J. Electron. Mater. 39, 863 (2010).

3. M. Niraula, K. Yasuda, K. Takagi, H. Kusama, M. Tominaga, Y. Yamamoto, Y. Agata, and K. Suzuki, J. Electron. Mater. 34, 815 (2005).

4. S.-H. Suh, J.-S. Kim, H.J. Kim, and J.-H. Song, J. Cryst. Growth 236, 119 (2002).

5. Q. Jiang, J.T. Mullins, J. Toman, T.P. Hase, B.J. Cantwell, G. Lloyd, A. Basu, and A.W. Brinkman, J. Cryst. Growth 310, 1652 (2008).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Formation mechanism and elimination of needle defects on CdZnTe epitaxial films prepared by close-spaced sublimation;Applied Surface Science;2024-06

2. TEM studies of structural defects in HgTe/HgCdTe quantum wells;Applied Nanoscience;2019-09-10

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