Characterizing the layer properties of AlGaAs/GaAs heteroface solar cell structures by specular spectral reflectance-Reference-Cited by-同舟云学术

Characterizing the layer properties of AlGaAs/GaAs heteroface solar cell structures by specular spectral reflectance

Published:2000-04 Issue:4 Volume:29 Page:436-442
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Algora Carlos

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-000-0157-6.pdf

Reference20 articles.

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4. G. Habermann, A. Bett, F. Lutz, C. Schetter, O.V. Sulima, and W. Wettling, Proc. 11th E.C. Photovoltaic Solar Energy Conf. (Chur, Switzerland: Harwood Academic Publ., 1992), pp. 217–220.

5. C. Algora, H. García, J.C. Maroto, G.L. Araújo, and A. Martí, Proc. 12th European Photov. Solar Energy Conf. (Bedford, U.K.: H.S. Stephens & Assoc., 1994), pp. 1417–1420.

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