1. S.K. Kang, A.K. Sarkhel. J. Electron. Mater. 23, 701 (1994) doi: 10.1007/BF02651362
2. S.W. Jeong, J.H. Kim, H.M. Lee. J. Electron. Mater. 33, 1530 (2004) doi: 10.1007/s11664-004-0095-9
3. S.K. Kang, W.K. Choi, D.-Y. Shih, D.W. Henderson, T. Gosselin, A. Sarkhel, C. Goldsmith, and K.J. Puttlitz, Proc. 53rd Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2003), pp. 64–70.
4. S.K. Kang, W.K. Choi, D.-Y. Shih, D.W. Henderson, T. Gosselin, A. Sarkhel, C. Goldsmith, and K.J. Puttlitz, JOM 55, 61 (2003) doi: 10.1007/s11837-003-0143-6
5. E. Laine, E. Perfecto, B. Campbell, J. Wood, J. Busby, J.␣Garant, and L. Guerin, Proc. 57th Electronic Components and Technology Conf. (Piscataway, NJ: IEEE, 2007), pp. 1320–1325.