Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions-Reference-Cited by-同舟云学术

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Thickness determination of ultrathin oxide films and its application in magnetic tunnel junctions

Published:2006-12 Issue:12 Volume:35 Page:2142-2146
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Yang J. Joshua,Ji Chengxiang,Yang Ying,Austin Chang Y.,Liu Feng X.,Pant Bharat B.,Schultz Allan E.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/s11664-006-0324-5.pdf

Reference29 articles.

1. S.A. Wolf, D.D. Awschalom, R.A. Buhrman, J.M. Daughton, S. von Molnár, M.L. Roukes, A.Y. Chtchelkanova, and D.M. Treger, Science 294, 1488 (2001).

2. J.S. Moodera, L.R. Kinder, T.M. Wong, and R. Meservey, Phys. Rev. Lett. 74, 3273 (1995).

3. J.S. Moodera, J. Nassar, and G. Mathon, Annu. Rev. Mater. Sci. 29, 381 (1999).

4. E.Y. Tsymbal, O.N. Mryasov, and P.R. LeClair, J. Phys. Condens. Matter 15, R109 (2003).

5. I. Zutic, J. Fabian, and S.D. Sarma, Rev. Mod. Phys. 76, 323 (2004).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Origin of the dependence of magnetoresistance on the composition of Co100−xFex electrodes in magnetic tunnel junctions;Journal of Applied Physics;2008-03

2. A New Scenario in Probe Local Oxidation: Transient Pressure-Wave-Assisted Ionic Spreading and Oxide Pattern Formation;Advanced Materials;2007-09-17

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