Evidence for 1/f noise in diffusion current due to insulator trapping and surface recombination velocity fluctuations-Reference-Cited by-同舟云学术

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Evidence for 1/f noise in diffusion current due to insulator trapping and surface recombination velocity fluctuations

Published:1993-08 Issue:8 Volume:22 Page:1081-1085
ISSN:0361-5235
Container-title:Journal of Electronic Materials
language:en
Short-container-title:Journal of Elec Materi

Author:

Schiebel R. A.,Blanks D.,Bartholomew D.,Kinch M. A.

Publisher

Springer Science and Business Media LLC

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://link.springer.com/content/pdf/10.1007/BF02817528.pdf

Reference18 articles.

1. S.P. Tobin, S. Iwasa and T.J. TredwellIEEE Trans. Elect. Dev. ED-27, 43 (1980).

2. W.W. Anderson and H.J. Hoffman,J. Vac. Sci. Technol. 1730, A1 (1983).

3. T.G.M. Kleinpenning,J. Vac. Sci. Technol. 17, A3 (1985).

4. W.A. Radford and C.E. Jones,J. Vac. Sci. Technol. 18, A3 (1985).

5. H.K. Chung, M.A. Rosenberg and P.H. Zimmerman,J. Vac. Sci. Technol. 189, A3 (1985).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Tobin Coefficient: A Relevant Photodetector Performance Metric for IR Imaging;Journal of Electronic Materials;2024-07-26

2. A model for 1/f noise in diffusion current based on surface recombination velocity fluctuations and insulator trapping;IEEE Transactions on Electron Devices;1994-05

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