Determination of the electrical resistance of a thin-film contact taking into account the spatial nonuniformity of the current distribution-Reference-Cited by-同舟云学术

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Determination of the electrical resistance of a thin-film contact taking into account the spatial nonuniformity of the current distribution

Published:2007-05 Issue:5 Volume:50 Page:538-542
ISSN:0543-1972
Container-title:Measurement Techniques
language:en
Short-container-title:Meas Tech

Author:

Lugin A. N.

Publisher

Springer Science and Business Media LLC

Subject

Applied Mathematics,Instrumentation

Link

http://link.springer.com/content/pdf/10.1007/s11018-007-0106-3.pdf

Reference20 articles.

1. O. M. Kresin and A. L. Kharinskii, Vopr. Radioélektron., Det. Kompon. Apparat., No. 5, 15 (1964).

2. Yu. P. Ermolaev and F. G. Karimova, Obmen Opyt. Radioélektron. Promyshl., No. 4, 15 (1965).

3. O. M. Kresin, I. M. Roginskii, and A. L. Kharinskii, Élektron. Tekh. Mikroélektron., No. 5, 96 (1967).

4. S. V. Kainov and E. A. Alekseeva, Élektron. Tekh. Radiokomp., No. 5, 120 (1967).

5. A. L. Kharinskii, Radio Apparatus Components Constructional Principles [in Russian], Énergiya, Leningrad (1971).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Self-temperature compensated thin-film resistor;AIP Conference Proceedings;2024

2. Multilayer thin-film resistive structures with temperature self-compensation for super-precision resistors and strain gauges;Journal of Physics: Conference Series;2022-12-01

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