1. A. M. Akhmetshin, V. I. Slavin, V. G. Tikhii, and E. D. Platonov, Defektoskopiya, No. 12, 57–65 (1983).
2. M. V. Andreev, V. F. Borul’ko, and O. O. Drobakhin, Defektoskopiya, No. 12, 41–50 (1995).
3. V. F. Borul’ko, O. O. Drobakhin, and I. V. Slavin, Multifrequency Microwave Nondestructive Methods for Measuring the Parameters of Layered Dielectrics, Izd. DGU, Dnepropetrovsk (1982).
4. Mohamed Abou-Khousa and R. Zoughi, IEEE Trans. Instrum. Measur., 56, No. 4, 1107–1113 (2007), https:/doi.org/https://doi.org/10.1098/rspa.2009.0664.
5. V. A. Mikhnev, E. Nyfors, and P. Vainkainen, IEEE Trans. Anten. Propag., 45, No. 9, 1405–1410 (1997), https:/doi.org/https://doi.org/10.1109/8.623130.