Author:
Shipley Roch J.,Stevenson Michael E.
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,Safety, Risk, Reliability and Quality,General Materials Science
Reference6 articles.
1. Becker, W.T., Shipley, R.J., Aliya, D.A.: Use of the term defect. J. Fail. Anal. Preven. 5(2), 16–20 (2005)
2. Wittke, J.H.: GLG 510 Electron Microprobe Techniques, Class Notes. Northern Arizona University (2008). http://www4.nau.edu/microanalysis/Microprobe/contents.html
3. Drouin, D., Couture, A.R., Joly, D., Tastet, X., Aimez, V., Gauvin, R.: CASINO V2.42—a fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users. Scanning 29, 92–101 (2007)
4. Wagner, L.C.: Failure Analysis of Integrated Circuits: Tools and Techniques. Springer (1999)
5. Goldstein, J.: Scanning Electron Microscopy and X-Ray Microanalysis, vol. 1. Springer (2003)
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