1. J. W. Mayer and J. F. Ziegler (eds.), Ion Beam Surface Layer Analysis, Elsevier Sequoia S.A., Lausanne (1974).
2. O. Meyer, G. Linker, and F. Käppeler (eds.), Ion Beam Surface Layer Analysis, Plenum Press, New York, 1976 (two volumes).
3. E. A. Wolicki, J. W. Butler, and P. A. Treado (eds.), Ion Beam Analysis, North-Holland, Amsterdam (1978).
4. J. A. Borders and S. T. Picraux, Characterization of silicon metallization systems using energetic ion backscattering, Proc. IEEE, 62, 1224–1231 (1974).
5. T. M. Buck and J. M. Poate, Ion scattering for analysis of surfaces and surface layers, J. Vac. Sci., 11, 289–296 (1974).