Author:
Krstić Angela,Cheng Kwang-Ting
Cited by
47 articles.
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1. Robust Pattern Generation for Small Delay Faults Under Process Variations;2023 IEEE International Test Conference (ITC);2023-10-07
2. An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
3. Basics of VLSI Testing and Debug;Understanding Logic Locking;2023-09-23
4. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023
5. Parametric and Fault Analysis of Next Generation High Speed Interconnects;2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON);2022-11-26