Author:
Krstić Angela,Cheng Kwang-Ting
Cited by
48 articles.
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1. Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations;2024 IEEE European Test Symposium (ETS);2024-05-20
2. Robust Pattern Generation for Small Delay Faults Under Process Variations;2023 IEEE International Test Conference (ITC);2023-10-07
3. An Evaluation of a Testability Measure for State Assignment to Estimate Transition Fault Coverage for Controllers;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
4. Basics of VLSI Testing and Debug;Understanding Logic Locking;2023-09-23
5. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023