1. W.S. Johnson and J.F. Gibbons, “Projected Range Statistics in Semiconductors”, (Stanford University Bookstore, 1969)
2. D.K. Brice, Proc. 1st Intern. Conf. on Ion Implantation in Semiconductors, edited by F.H. Eisen and L.T. Chadderton (Gordon and Breach, New York, 1971) p. 101
3. S. Furukawa, H. Matsumura, and H. Ishiwara, Japan. J. Appl. Phys. 11, 134 (1972)
4. S. Mylroie and J.F. Gibbons, Proc. 3rd Intern. Conf. on Ion Implantation in Semiconductors and Other Materials, edited by B.L. Crowder (Plenum Press, New York, 1973) p. 243
5. P. Sigmund and J.B. Sanders, Proc. Intern. Conf. on Application of Ion Beams to Semiconductor Technology, Grenoble, edited by P. Glotin (1967) p. 215