Room Temperature Photo-Luminescence Imaging of Dislocations in GaAs Wafers-Reference-Cited by-同舟云学术

Room Temperature Photo-Luminescence Imaging of Dislocations in GaAs Wafers

Published:1987 Issue: Volume: Page:1369-1376
ISSN:
Container-title:Review of Progress in Quantitative Nondestructive Evaluation
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Author:

Guidotti D.,Hovel H. J.,Albert M.,Becker J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-1893-4_155

Reference15 articles.

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3. S. Miyazawa, T. Honda, Y. Ishii and S. Ishida, Appl. Phys. Lett. 44, 410 (1984).

4. K. Bohm and B. Fischer, J. Appl. Phys. 50, 5453 (1979).

5. K. Kitahara, M. Ozeki and A. Shibatomi, Fujitsu Sci. Tech. J. 19, 279 (1983).

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