1. Reviews are given by H. Alexander and P. Haasen,Solid State Physics, edited by H. Ehrenreich, F. Seitz, and D. Turnbull. (Academic, New York, 1968), Vol. 22;
2. Lattice Defects in Semiconductors, Inst, of Physics Conf. Ser. No. 23 (Institute of Physics, London, 1975);
3. Advances in the optical analysis of semiconductor materials
4. A. T. Vink, C. J. Werkhoven, and C. v. Opdorp, inSemiconductor Characterization Techniques, edited by P. A. Barnes and G. A. Rozgonyi (Electrochemical Society, Princeton, 1978) Proc. Vol. 78-3, p. 259.
5. H. Mataré,Defect Electronics in Semiconductors(Wiley, New York, 1971);