1. J. Stephen Burgler and Paul G. Jespers, “Charge Pumping in MOS Transistors”, IEEE Trans. El. Dev., ED-16, p. 297, 1969.
2. Alexander B.M. Elliot, “The Use of Charge Pumping Currents to Measure Surface State Densities in MOS Transistors”, Sol. St. El., 19, p. 241, 1976.
3. Guido Groeseneken, Herman E. Maes, Nicolas Beltran, and Roger F. De Keersmaecker, “A Reliable Approach to Charge-Pumping Measurements in MOS Transistors”, IEEE Trans. El. Dev., ED-31, p. 42, 1984.
4. Paul Heremans, Johan Witters, Guido Groeseneken and Herman Maes, “Analysis of the Charge Pumping Technique and its Application for the Evaluation of MOSFET Degradation”, IEEE Trans. El. Dev., ED-36, p. 1318, 1989.
5. W.V. Backensto and C.R. Viswanathan, “Measurement of Interface State Characteristics of MOS Transistor Utilizing Charge Pumping Techniques”, Proc. IEE, Vol 128, pt. 1, p. 44, 1981.