Depth Profiling by Means of the ERDA ExB Technique-Reference-Cited by-同舟云学术

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Depth Profiling by Means of the ERDA ExB Technique

Published:1996 Issue: Volume: Page:163-194
ISSN:
Container-title:Forward Recoil Spectrometry
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Author:

Ross Guy

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-0353-4_7.pdf

Reference24 articles.

1. L’Ecuyer, J., Brassard, C., Cardinal, C., Chabbal, J., Deschenes, L., Labrie, J. P., Terreault, B., Martel, J. C., and Saint-Jacques, R. J., An accurate and sensitive method for the determination of the depth distribution of light elements in heavy materials, J. Appl. Phys. 47, 381 (1976).

2. Ross, G. G., and Terreault, B., High-precision depth profiling of light isotopes in low-atomic-mass solids, J. Appl. Phys. 51, 1259 (1980).

3. Ross, G. G., Terreault, B., G.beil, G., Abel, G., Boucher, C., and Veilleux, G., Inexpensive, quantitative hydrogen depth profiling for surface probes, J. Nucl. Mater. 128/129, 730 (1984).

4. Ross, G. G., and Leblanc, L., Depth profiling of hydrogen and helium isotopes by means of the ERD-ExB technique, Nucl. Instrum. Methods Phys. Res. Sect. B 62, 484 (1992).

5. Ross, G. G., Leblanc, L., Terreault, B., Pageau, J. F, and Gollier, P. A., Nuclear microanalysis by means of 350-keV Van de Graaff accelerator, Nucl. Instrum. Methods Phys. Res. Sect. B 66, 17 (1992).

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1. Depth distribution of 0.4–1.6 keV deuterium ions implanted into polystyrene and hydrogenated carbon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2000-04

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