Power-Gating for Leakage Control and Beyond-Reference-Cited by-同舟云学术

Power-Gating for Leakage Control and Beyond

Published:2014-10-16 Issue: Volume: Page:175-205
ISSN:
Container-title:Circuit Design for Reliability
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Author:

Calimera Andrea,Macii Alberto,Macii Enrico,Poncino Massimo

Publisher

Springer New York

Link

http://link.springer.com/content/pdf/10.1007/978-1-4614-4078-9_9

Reference35 articles.

1. M. Alam (2008) “Reliability- and process-variation aware design of integrated circuits,” in Microelectronics Reliability, 48(8):1114–1122.

2. M. Anis, S. Areibi, M. Elmasry (2003) “Design and optimization of multi-threshold CMOS (MTCMOS) circuits,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 22(10):1324–1342.

3. P. Babighian, L. Benini, A. Macii, E. Macii (2006) “Enabling fine-grain leakage management by voltage anchor insertion,” IEEE Design, Automation and Test in Europe (DATE’06), pp. 868–873.

4. D. Boning, S. Nassif (2000) “Models of process variations in device and interconnect,” in Design of High Performance Microprocessor Circuits, Wiley.

5. S. Borkar (2005) “Designing reliable systems from unreliable components: The challenges of transistor variability and degradation,” IEEE Micro, 25(6):10–16.

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