A Dynamically Generated Rapid Response Capacity Planning Model for Semiconductor Fabrication Facilities

Author:

Fordyce Kenneth,Sullivan Gerald

Publisher

Springer US

Reference14 articles.

1. Dayhoff, J. and Atherton, R. 1987, “A Model for Wafer Fabrication Dy namics in Integrated Circuit Manufacturing,” IEEE Transactions on Sys tems, Man, and Cybernetics, Vol. SMC-17, No. 1, pp. 91–100.

2. Fowler, J. and Robinson, J. 1994a, “Measurement and Improvement of Manufacturing Capacity (MIMAC) Project Bibliography,” SEMATECH, 2706 Montopolis Drive, Austin, Texas 78741–6499

3. Fowler, J. and Robinson, J. 1994b, “Control of Workcell with Sequence Dependent Setups,” TIMS/ORSA, Boston, April 29, 1994.

4. Fordyce, K., Hannan, E., and Sullivan, G. 1991, “A Goal Programming Al gorithm Using a Smart Selection of Entering and Leaving Variables Mod ification to the Simplex Algorithm,” IBM, MS 922, Kingston, NY 12401.

5. Fordyce, K., Gerard, B., Jesse, R., Sell, R., and Sullivan, G. 1992a, “Daily Output Planning:Integrating Operations Research, Artificial Intelligence, & Real-time Decision Support,” Expert System Applications, Vol. 5, pp. 245–256.

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