A Noninvasive Optical Probe for Detecting Electrical Signals in Silicon IC’s-Reference-Cited by-同舟云学术

A Noninvasive Optical Probe for Detecting Electrical Signals in Silicon IC’s

Published:1988 Issue: Volume: Page:1161-1166
ISSN:
Container-title:Review of Progress in Quantitative Nondestructive Evaluation
language:
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Author:

Heinrich H. K.,Hemenway B. R.,Marsland R. A.,Bloom D. M.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4613-0979-6_34.pdf

Reference9 articles.

1. B.H. Kolner, and D.M. Bloom, “Direct electro-optic sampling of transmission line signals propagating on a GaAs substrate,” Electron. Lett. 20, 818 (1984)

2. B.H. Kolner, D.M. Bloom, “Electrooptic sampling in GaAs integrated circuits”, IEEE J. Quantum Electron. QE-22, 79 (1986)

3. K.J. Weingarten, M.J.W. Rodwell, H.K. Heinrich, B.H. Kolner, and D.M. Bloom, “Direct electro-optic sampling of GaAs integrated circuits”, Electron. Lett. 21, 765 (1985)

4. M.J.W. Rodwell, M. Riaziat, K.J. Weingarten, B.A. Auld. and D.M. Bloom, “Internal Microwave Propagation and Distortion Characteristics of Traveling-Wave Amplifiers Studied bv Electrooptic Sampling”, IEEE Trans. MTT-34, 1356(1986)

5. H.K. Heinrich, D.M. Bloom, and B.R. Hemenway, “Noninvasive sheet charge density probe for integrated silicon devices”, Appl. Phys. Lett. 48, 1066 (1987)

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