History of APT and LEAP
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Publisher
Springer New York
Link
http://link.springer.com/content/pdf/10.1007/978-1-4614-8721-0_1
Reference75 articles.
1. Müller, E.W., Panitz, J.A., McLane, S.B.: The atom-probe field ion microscope. Rev. Sci. Instrum. 39, 83–86 (1968)
2. Panitz, J.A.: The 10 cm atom probe. Rev. Sci. Instrum. 44(8), 1034–1038 (1973)
3. Cerezo, A., Godfrey, T.J., Smith, G.D.W.: Application of a position-sensitive detector to atom probe microanalysis. Rev. Sci. Instrum. 59(6), 862–866 (1988)
4. Kelly, T.F., Camus, P.P., Larson, D.J., Holzman, L.M., Bajikar, S.S.: On the many advantages of local-electrode atom probes. Ultramicroscopy 62, 29–42 (1996)
5. Kelly, T.F., Larson, D.J.: Local electrode atom probes. Mater. Char. 44(1–2), 59–85 (2000)
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1. Open and strong-scaling tools for atom-probe crystallography: high-throughput methods for indexing crystal structure and orientation;Journal of Applied Crystallography;2021-10-01
2. On strong-scaling and open-source tools for analyzing atom probe tomography data;npj Computational Materials;2021-01-29
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