Author:
Wood Michael H.,Muzik Arthur,Huston Hance H.,Rathore Hazara
Reference16 articles.
1. Butkov, E. (1968). Mathematical Physics. Reading, MA: Addison-Wesley.
2. Campbell, E.A. (1969). Failure Mechanisms in Semiconductor Devices. New York: Wiley.
3. Gumbel, E.J. (1958). Statistics of Extremes. New York: Columbia University Press.
4. Hu, V. (1989). “Reliability Issues of MOS and Bipolar IC’s.” In Proc. IEEE Conf. on Computer Design, p. 38.
5. Huston, H., Wood, M., and Depalma, V. (1991). “Burn-in Effectiveness—Theory and Measurement.” In Proc. Int. Rel. Phys. Symp., p. 271.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A stochastic process for modeling failures of a system having a non-monotonic hazard rate function;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2019-01-10