Author:
Khare Jitendra B.,Maly Wojciech
Cited by
5 articles.
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1. Variation-aware fault modeling;Science China Information Sciences;2011-08-03
2. Fault Modeling for Simulation and ATPG;Models in Hardware Testing;2009-10-27
3. SUPERB;ACM Transactions on Design Automation of Electronic Systems;2009-08
4. Introduction;Defect Oriented Testing for CMOS Analog and Digital Circuits;1999
5. Introduction;Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits