Author:
Annegarn H. J.,Keddy R. J.,Madiba C. C. P.,Renan M. J.,Sellschop J. P. F.
Reference17 articles.
1. S.A.E. Johansson and T.B. Johansson, “Analytical Application of Particle Induced X-Ray Emission”, Nucl. Instr. and Meth. 137, 478–516 (1976).
2. T.B. Johansson, R. Akselsson and S.A.E. Johansson, “X-Ray Analysis: Elemental Trace Analysis at the 10–12 g Level”, Nucl. Instr. and Meth. 84, 141–143 (1970).
3. S.A.E. Johansson (Ed.),“Particle Induced X-Ray Emission and its Analytical Applications” Proc. Int. Conf. Lund 1976, Nucl. Instr. and Meth. 142, 1–338 (1977).
4. F.S. Goulding and J.M. Jaklevic, “XRF Analysis–Some Sensitivity Comparisons Between Charged Particle and Photon Excitation”, Nucl. Instr. and Meth. 142, 323–332 (1977).
5. J. Scheer, L. Voet, U. Wätjen, K. Koenig, F.W. Richter and U. Steiner, “Comparison of Sensitivities in Trace Element Analysis obtained by X-Ray Excited X-Ray Fluorescence and Photon Induced X-Ray Emission”, Nucl. Instr. and Meth. 142, 333–338 (1977).
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Geological and mineralogical applications of PIXE: A review;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1990-04