Comparison of sensitivities in trace element analysis obtained by X-ray excited X-ray fluorescence and proton induced X-ray emission-Reference-Cited by-同舟云学术

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Comparison of sensitivities in trace element analysis obtained by X-ray excited X-ray fluorescence and proton induced X-ray emission

Published:1977-04 Issue:1-2 Volume:142 Page:333-338
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Scheer J.,Voet L.,Wätjen U.,Koenig W.,Richter F.W.,Steiner U.

Publisher

Elsevier BV

Subject

General Medicine

Reference3 articles.

1. W. Koenig, F. W. Richter, U. Steiner, R. Stock, R. Thielmann and U. Wätjen, these Proceedings, p. 225.

2. Proton induced X-ray emission as a tool for trace element analysis

3. I. Hasselmann, W. Koenig, F. W. Richter, U. Steiner, U. Wätjen, J. Chr. Bode and W. Ohta, these Proceedings, p. 163.

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparison of different excitation methods for X-ray spectral analysis;Fresenius' Zeitschrift für analytische Chemie;1987-01

2. Sample inhomogeneity in PIXE analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04

3. Chapter 5 Analysis by heavy ion induced X-ray emission;Progress in Crystal Growth and Characterization;1984-01

4. References;Fundamentals of Energy Dispersive X-ray Analysis;1984

5. Sample characterization by proton induced x-ray emission analysis;Applications of Surface Science;1982-08

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