Exhaustive testing of almost all devices with outputs depending on limited number of inputs-Reference-Cited by-同舟云学术

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Exhaustive testing of almost all devices with outputs depending on limited number of inputs

Published:1994-10 Issue:3 Volume:2 Page:303-318
ISSN:1230-1612
Container-title:Open Systems & Information Dynamics
language:en
Short-container-title:Open Syst Inf Dyn

Author:

Levitin L. B.,Karpovsky M. G.

Publisher

Springer Science and Business Media LLC

Subject

Mathematical Physics,Statistics and Probability,Statistical and Nonlinear Physics

Link

http://link.springer.com/content/pdf/10.1007/BF02228856.pdf

Reference18 articles.

1. A. K. Ibarra and S. Sahni, IEEE Trans. Comput.C-24, 242 (1975).

2. A. K. Chandra, L. T. Kau, G. Markowsky, and S. Zaks, IBM Research ReportRC-8336 (1981).

3. Z. Barzilai, D. Coppersmith, and A. Rosenberg, IBM Research ReportRE-8570 (1981).

4. D. T. Tang and L. S. Wao, IBM Research ReportRC-9442 (1982).

5. D. T. Tang and C. L. Chen, IBM Research ReportRC-10064 (1983).

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1. Pseudo-Exhaustive Testing Based on March Tests;Multi-run Memory Tests for Pattern Sensitive Faults;2018-07-07

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