Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation,Radiation
Reference70 articles.
1. R.M.A. Azzam, N.M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977)
2. H.G. Tompkins, W.A. McGahan, Spectroscopic Ellipsometry and Reflectometry: A Users Guide (Wiley, New York, 1999)
3. H.G. Tompkins, E.A. Irene (eds.), Handbook of Ellipsometry (William Andrew, New York, 2005)
4. M. Schubert, Infrared Ellipsometry On Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons (Springer, Heidelberg, 2004)
5. H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (Wiley, New York, 2007)
Cited by
29 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献