Enhanced phase-shifting measurement with a double-passed Michelson interferometer
Author:
Publisher
Springer Science and Business Media LLC
Subject
Atomic and Molecular Physics, and Optics
Link
https://link.springer.com/content/pdf/10.1007/s10043-023-00814-y.pdf
Reference8 articles.
1. Hohm, U., Kerl, K.: A Michelson twin interferometer for precise measurements of the refractive index of gases between 100 K and 1300 K. Meas. Sci. Technol. 1, 329–336 (1990)
2. Sterkenburg, S.W.P.V., Kwaaitaal, Th., van den Eijnden, W.M.M.M.: A double Michelson interferometer for accurate measurements of electrostrictive constants. Rev. Sci. Instrum. 61(9), 2318–2322 (1990)
3. Bennett, S.J.: A double-passed Michelson interferometer. Opt. Commun. 4(6), 428–430 (1972)
4. Muñoz, V.H.F., Arellano, N.-I.T., García, D.I.S., García, A.M., Zurita, G.R., Lechuga, L.G.: Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms. Appl. Opt. 55(15), 4047–4051 (2016)
5. Harimoto, T., Toshima, K.: A Michelson twin interferometer for effective compensation for environment disturbance. Jpn. J. Appl. Phys. 57(10), 108003 (2018)
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