Non-imaging ray-tracing for sputtering simulation with apodization

Author:

Ou Chung-JenORCID

Funder

Ministry of Science and Technology, Taiwan

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics

Reference11 articles.

1. Deppisch, V.G.: Schichtdickengleichmaβigkeit von aufgdampften schichten in theorie und praxis. Vakuum-Technik 30(3), 67 (1981)

2. Ohring, M.: The Material Science of the Film, pp. 24–28. Academic Press Limited, London (1992). ISBN:012524990

3. Fan, Q.H., Chen, X.H., Zhang, Y.: Computer simulation of film thickness distribution in symmetrical magnet magnetron sputtering. Vacuum 46(3), 229 (1995)

4. Nanbua, K., Uchida, S.: Computer simulation of growth of thin films fabricated by the sputtering method: comparison with experiment. Thin Solid Films 228(1), 330 (1993)

5. Hong, D.N. (ed.): Vacuum Technology and Application, 6th edn, p. 354. Instrument Technology Research Center Publisher, National Applied Research Laboratories, Hsinchu (2006). ISBN: 9570286768

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