Highly reliable operation under high case temperature in 638-nm BA-LD-Reference-Cited by-同舟云学术

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Highly reliable operation under high case temperature in 638-nm BA-LD

Published:2019-01-02 Issue:1 Volume:26 Page:201-212
ISSN:1340-6000
Container-title:Optical Review
language:en
Short-container-title:Opt Rev

Author:

Kuramoto Kyosuke^ORCID,Abe Shinji,Miyashita Motoharu,Kusunoki Masatsugu,Nishida Takehiro,Yagi Tetsuya

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics

Link

http://link.springer.com/content/pdf/10.1007/s10043-018-0478-4.pdf

Reference14 articles.

1. Kuroda, K., Yamamoto, K., Kurimura, N.: Rezadeisupurei (laser display) Optronics-sya, Tokyo, pp 1 (2010) [in Japanese]

2. Yamamoto, K.: Optronics 376, 134 (2013) [in Japanese]

3. Yagi, T.: Rezakenkyu 41(4), 225 (2013) [in Japanese]

4. Buckley, E.: SID Digest 1074 (2008)

5. Yagi, T., Shimada, N., Nishida, T., Mitsuyama, H., Miyashita, M.: Proc. IDW’12, 2021 (2012)

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Slow degradation of a multiemitter 638-nm high-power broad-area laser diode during long-term aging;Optical Engineering;2020-10-05

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