Slow degradation of a multiemitter 638-nm high-power broad-area laser diode during long-term aging
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Published:2020-10-05
Issue:10
Volume:59
Page:
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ISSN:0091-3286
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Container-title:Optical Engineering
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language:
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Short-container-title:Opt. Eng.
Author:
Kuramoto Kyosuke1,
Abe Shinji1,
Miyashita Motoharu1,
Nishida Takehiro1,
Yagi Tetsuya1
Affiliation:
1. Mitsubishi Electric Corporation, Itami
Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics