Reliability Issues and Solutions in Flexible Electronics Under Mechanical Fatigue
-
Published:2018-03-06
Issue:4
Volume:14
Page:387-404
-
ISSN:1738-8090
-
Container-title:Electronic Materials Letters
-
language:en
-
Short-container-title:Electron. Mater. Lett.
Author:
Yi Seol-Min, Choi In-Suk, Kim Byoung-JoonORCID, Joo Young-Chang
Funder
National Research Foundation of Korea Ministry of Trade, Industry and Energy
Publisher
Springer Science and Business Media LLC
Subject
Electronic, Optical and Magnetic Materials
Reference104 articles.
1. Rogers, J.A., Bao, Z., Baldwin, K., Dodabalapur, A., Crone, B., Raju, V.R., Kuck, V., Katz, H., Amundson, K., Ewing, J., Drzaic, P.: Proc. Natl. Acad. Sci. USA 98, 4835 (2001) 2. Khafe, A.B.M., Sakai, W., Watanabe, H., Yamauchi, H., Kuniyoshi, S., Sakai, M., Kudo, K.: Jpn. J. Appl. Phys. 53, 05FF07 (2014) 3. Forrest, S.R.: Nature 428, 911 (2004) 4. Lo, C.-Y., Kiitola-Keinänen, J., Huttunen, O.-H., Petäjä, J., Hast, J., Maaninen, A., Kopola, H., Fujita, H., Toshiyoshi, H.: Jpn. J. Appl. Phys. 48, 06FC04 (2009) 5. Koo, M., Park, K.I., Lee, S.H., Jeon, D.Y., Choi, J.W., Kang, K., Lee, K.J.: Nano Lett. 12, 4810 (2012)
Cited by
40 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
|
|