1. See e.g. IEEE 1990 International Electron Devices Meeting, Technical Digest
2. W. Beinvogl and E. Hopf, Adv. Solid State Phys. 28, 87 (1988)
3. W. Beinvogl and W. Müller, Ext. Abstr. 22 nd (1990) Int. Conf. Solid State Devices and Materials (SSDM), Sendai (1990) p. 829
4. B.O. Kolbesen, W. Bergholz and H. Wendt, Proc. Int. Conf. Defects in Semiconductors (ICDS-15) Budapest (1988), Mat. Sci. Forum, Vols. 38-41 (1989) p. 1
5. B.O. Kolbesen, W. Bergholz, H. Cerva, F. Gelsdorf, H. Wendt and G. Zoth, Inst. Phys. Conf. Ser. 104, 421 (1989)