Ion Beam-Based Characterization of Multicomponent Oxide Thin Films and Thin Film Layered Structures-Reference-Cited by-同舟云学术

Ion Beam-Based Characterization of Multicomponent Oxide Thin Films and Thin Film Layered Structures

Published:1993 Issue: Volume: Page:251-281
ISSN:
Container-title:Multicomponent and Multilayered Thin Films for Advanced Microtechnologies: Techniques, Fundamentals and Devices
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Author:

Krauss A. R.,Rangaswamy M.,Lin Y.,Gruen D. M.,Schultz J. A.,Schmidt H. K.,Chang R. P. H.

Publisher

Springer Netherlands

Link

http://link.springer.com/content/pdf/10.1007/978-94-011-1727-2_15

Reference76 articles.

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2. M. Hawley, I. D. Raistrick, J. G. Beery, and R. J. Houlton, Science 251 (1991) 279

3. D. P. Smith, Surf. Sci. 25 (1971) 171

4. J.T. McKinney and R.P. Frankenthal, Proc. Annual Meeting National Association of Corrosion Engineers, March 22, 1973, Anaheim, CA.

5. D. P. Smith, J. Appl. Phys. 38 (1967) 340

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3. Time-of-Flight, Ion-Beam Surface Analysis for In Situ Characterization of Thin-Film Growth Processes;MRS Bulletin;1995-05