Author:
O’Flynn Colin,Chen Zhizhang
Publisher
Springer International Publishing
Cited by
147 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automating Side-Channel Testing for Embedded Systems: A Continuous Integration Approach;Proceedings of the 19th International Conference on Availability, Reliability and Security;2024-07-30
2. Modeling Clock Glitch Fault Injection Effects on a RISC-V Microcontroller;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
3. SCAR: Power Side-Channel Analysis at RTL Level;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06
4. Efficient and Side-Channel Resistant Ed25519 on ARM Cortex-M4;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-06
5. Tolerance Evaluation Against Deep Learning Side-Channel Attack on AES in Automotive Microcontroller With Uncertain Leakage Model;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20