The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation-Reference-Cited by-同舟云学术

The Spherical Harmonics Expansion Method for Assessing Hot Carrier Degradation

Published:2014-10-04 Issue: Volume: Page:197-220
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Container-title:Hot Carrier Degradation in Semiconductor Devices
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Author:

Bina Markus,Rupp Karl

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-08994-2_6

Reference55 articles.

1. S.E. Rauch, F. Guarin, The energy driven hot carrier model, in Hot Carrier Degradation in Semiconductor Devices, ed. by T. Grasser. (Springer, Cham, 2014)

2. S. Tyaginov, Physics-based modeling of hot-carrier degradation, in Hot Carrier Degradation in Semiconductor Devices, ed. by T. Grasser. (Springer, Cham, 2014)

3. S. Tyaginov, I. Starkov, C. Jungemann, H. Enichlmair, J. Park, T. Grasser, in Proceedings of ESSDERC, pp. 151–154 (2011)

4. S. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J. Park, H. Enichlmair, M. Karner, C. Kernstock, E. Seebacher, R. Minixhofer, H. Ceric, T. Grasser, in Proceedings of IPFA, pp. 1–5 (2010)

5. M. Bina, K. Rupp, S. Tyaginov, O. Triebl, T. Grasser, in IEEE International Electron Devices Meeting (IEDM), pp. 30.5.1–30.5.4 (2012)

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