Evidence of a Larger EM-Induced Fault Model-Reference-Cited by-同舟云学术

Evidence of a Larger EM-Induced Fault Model

Published:2015 Issue: Volume: Page:245-259
ISSN:0302-9743
Container-title:Smart Card Research and Advanced Applications
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Author:

Ordas S.,Guillaume-Sage L.,Tobich K.,Dutertre J.-M.,Maurine P.

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-16763-3_15

Reference13 articles.

1. Lecture Notes in Computer Science;P Bayon,2012

2. Lecture Notes in Computer Science;D Boneh,1997

3. Dehbaoui, A., Dutertre, J.-M., Robisson, B., Orsatelli, P., Maurine, P., Tria, A.: Injection of transient faults using electromagnetic pulses -practical results on a cryptographic system. IACR Cryptology ePrint Archive, 2012:123 (2012)

4. Dehbaoui, A., Dutertre, J.-M., Robisson, B., Tria, A.: Electromagnetic transient faults injection on a hardware and a software implementations of AES. In: FDTC, pp. 7–15 (2012)

5. Lecture Notes in Computer Science;K Gandolfi,2001

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