A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models-Reference-Cited by-同舟云学术

A Tale of Two Models: Discussing the Timing and Sampling EM Fault Injection Models

Published:2023-09-10 Issue: Volume: Page:
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Container-title:2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)
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Author:

Nabhan Roukoz¹,Dutertre Jean-Max¹,Rigaud Jean-Baptiste¹,Danger Jean-Luc²,Sauvage Laurent²

Affiliation:

1. Mines Saint-Etienne, CEA, Leti, Centre CMP,Gardanne,France,F-13541

2. Institut Mines-Telecom,LTCI, Télécom Paris,Palaiseau,France,91120

Funder

French National Research Agency (ANR)

Publisher

IEEE

Link

Reference13 articles.

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. EM Fault Injection-Induced Clock Glitches: From Mechanism Analysis to Novel Sensor Design;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

3. Choose your Path: Control of Ring Oscillators EMFI Susceptibility through FPGA P&R Constraints;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03