A Scanning Electrostatic Force Microscope for the Measurement of Material Distribution in Non-contact Condition
Author:
Publisher
Springer International Publishing
Link
https://link.springer.com/content/pdf/10.1007/978-3-319-64943-6_40
Reference8 articles.
1. Giessibl FJ (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Phys Rev B 56(24):16010–16015
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3. Herbert BM (1977) The work function of the elements and its periodicity. J Appl Phys 48:4729
4. Takahashi T (2011) Photoassisted Kelvin probe force microscopy on multicrystalline Si solar cell materials. Jpn J Appl Phys 50:08LA05
5. Meyer G, Amer NM (1990) Reprinted with permission from simultaneous measurement of lateral and normal forces with an optical-beam-deflection atomic force microscope. Appl Phys Lett 57(20):2089
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