Debugging Methods Through Identification of Appropriate Functions for Internal Gates

Author:

Oshima Kosuke,Matsumoto Takeshi,Fujita Masahiro

Publisher

Springer International Publishing

Reference15 articles.

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2. Jo, S., Matsumoto, T., Fujita, M.: SAT-based automatic rectification and debugging of combinational circuits with LUT insertions. In: 2012 IEEE 21st Asian Test Symposium (ATS), pp. 19–24. IEEE Press, New York (2012)

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