Fundamentals of Electromigration
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-73558-0_2
Reference47 articles.
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3. J.R. Black, Electromigration—a brief survey and some recent results. IEEE Trans. Electron Devices 16(4), 338–347 (1969). https://doi.org/10.1109/T-ED.1969.16754
4. J.R. Black, Electromigration failure modes in aluminum metallization for semiconductor devices. Proc. of the IEEE 57(9), 1587–1594 (1969). https://doi.org/10.1109/PROC.1969.7340
5. I.A. Blech, Electromigration in thin aluminum films on titanium nitride. J. Appl. Phys. 47(4), 1203–1208 (1976). https://doi.org/10.1063/1.322842
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