Publisher
Springer International Publishing
Reference16 articles.
1. EDCC-2 Companion Workshop on Dependable Computing, Workshop Proceedings. Silesian Technical University, Department of Automatic Control, Electronics and Computer Science, Gliwice, 15 May 1996 (1997). ISBN 83-906582-1-6
2. Agarwal, V.K., Fung, A.S.: Multiple fault testing of logic circuits by single fault test sets. IEEE Trans. Comput. C–30(11), 855–865 (1981)
3. Koeter, J.: What’s an LFSR? Texas Instruments (1996)
4. Gościniak, I.: Extended class of linear feedback shift registers. In: ICSES, International Conference on Signals and Electronic Systems, Poland (2016)
5. Novak, O., Pliva, Z., Nosek, J., Hławiczka, A., Garbolino, T., Gucwa, K.: Test-per-clock logic BIST with semi-deterministic test patterns and zero-aliasing compactor. J. Electron. Test. Theory Appl. 20, 109–122 (2004)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献