A Technique of Analog Circuits Testing and Diagnosis Based on Neuromorphic Classifier
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Publisher
Springer International Publishing
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http://link.springer.com/content/pdf/10.1007/978-3-319-28658-7_33
Reference13 articles.
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3. Cherubal, S., Chatterjee, A.: Parametric fault diagnosis for analog systems using functional mapping. In: Proc. of the DATE Conference (1999). doi: 10.1145/307418.307489
4. Aminian, M., Aminian, F.: Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans. Circuits Syst. II 47(2), 151–156 (2000). doi: 10.1109/82.823545
5. Barua, A., Kabisatpathy, P., Sinha, S.: A method to diagnose faults in analog integrated circuits using artificial neural networks with pseudorandom noise as stimulus. In: Proc. of 10th IEEE Int. Conf. on Electronics Circuits and Syst. (2003). doi: 10.1109/ICECS.2003.1302050
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1. Machine Learning and Data Mining Methods in Testing and Diagnostics of Analog and Mixed-Signal Integrated Circuits: Case Study;Communications in Computer and Information Science;2019
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