Author:
Ademujimi Toyosi Toriola,Brundage Michael P.,Prabhu Vittaldas V.
Publisher
Springer International Publishing
Reference33 articles.
1. Kegg, R.: One-line machine and process diagnostics. CIRP Ann. Manuf. Technol. 33(2), 469–473 (1984)
2. Weiss, B., Vogl, G., Helu, M., Qiao, G., Pellegrino, J., Justiniano, M., Raghunathan, A.: Measurement science for prognostics and health management for smart manufacturing systems: key findings from a roadmapping workshop. In: 2015 Annual Conference of the Prognostics and Health Management Society (2015)
3. Charniak, E.: Bayesian networks without tears. AI Mag. 12(4), 50 (1991)
4. De, S., Das, A., Sureka, A.: Product failure root cause analysis during warranty analysis for integrated product design and quality improvement for early results in downturn economy. Int. J. Prod. Dev. 12(3–4), 235–253 (2010)
5. Pradhan, S., Singh, R., Kachru, K., Narasimhamurthy, S.: A Bayesian network based approach for root-cause-analysis in manufacturing process. In: 2007 International Conference on Computational Intelligence and Security, pp. 10–14. IEEE, Harbin (2007)
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