1. Maeda, S., Ono, M., Kubota, H., Nakatani, M.: Precise detection of short circuit defect on TFT substrate by infrared image matching. J. IEICE J80-D-II CD-II(9), 2333–2344 (1997)
2. Numada, M., Koshimizu, H.: A method for detecting globally distributed defects by using learning with Mahalanobis distance. In: ViEW2007, pp. 9–13 (2007)
3. Rau, H., Wu, C.-H.: Automatic optical inspection for detecting defects on printed circuit board inner layers. Int. J. Adv. Manuf. Technol. 25(9–10), 940–946 (2005)
4. Roh, B., Yoon, C., Ryu, Y., Choonsuk, O.: A neural network approach to defect classification on printed circuit boards. JSPE 67(10), 1621–1626 (2001)
5. Futamura, K., Iwahori, Y., Fukui, S., Kawanaka, H.: Defect classification of electronic board using SVM and table matching. In: MIRU2009, IS1-2, pp. 420–427 (2009)