Zinc Oxide Thin Films Characterization, AFM, XRD and X-ray Reflectivity
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials
Link
http://link.springer.com/content/pdf/10.1007/s40799-016-0117-6.pdf
Reference46 articles.
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3. Hickernell, F.S., “DC Triode Sputtered Zinc Oxide Surface Elastic Wave Transducers,” Journal of Applied Physics 44: 1061–1071 (2009).
4. Hauden, D., Hoummady, M., Choujaa, A., and Bastien, F., “Elastic Wave Sensors – Quartz Technological Channel and Silicon Technology,” Sensors and Actuators A 33: 99–102 (1992).
5. Itoh, T., and Suga, T., “Development of a Force Sensor for Atomic Force Microscopy Using Piezoelectric Thin Films,” Nanotechnology 4: 218 (1993).
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