Depth resolved structural study of heavy ion induced phase formation in Si/Fe/Si trilayer
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-540-78697-9_93.pdf
Reference11 articles.
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2. Bauer, Ph., Dufour, C., Jaouen, C., Marchal, G., Pacaud, J., Grilhé, J., Jousset, J.C.: High electronic excitations and ion beam mixing effects in high energy ion irradiatied Fe/Si multilayers. J. Appl. Phys. 81, 116–125 (1997)
3. Dhuri, P., Gupta, A., Chaudhari, S.M., Phase, D.M., Avasthi, D.K.: Swift heavy ion irradiation and annealing effects in Fe/Si multilayers. Nucl. Instrum. Methods Phys. Res. B 156, 148–152 (1999)
4. Gupta, A., Rajput, P., Saraiya, A., Reddy, V.R., Gupta, M., Bernstorff, S., Amenitsch, H.: Depth profiling of marker layers using x-ray waveguide structures. Phys. Rev. B 72, 075436 (2005)
5. Wang, Z.G., Dufour, Ch., Paumier, E., Toulemonde, M.: The Se sensitivity of metals under swift-heavy-ion irradiation: a transient thermal process. J. Phys. Condens. Matter 6, 6733–6750 (1994)
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