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Depth profiling of marker layers using x-ray waveguide structures

Published:2005-08-24 Issue:7 Volume:72 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Gupta Ajay,Rajput Parasmani,Saraiya Amit,Reddy V. R.,Gupta Mukul,Bernstorff Sigrid,Amenitsch H.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.72.075436/fulltext

Reference39 articles.

1. X-ray flux enhancement in thin-film waveguides using resonant beam couplers

2. X‐ray Fraunhofer diffraction patterns from a thin‐film waveguide

3. Phase contrast hard x-ray microscopy with submicron resolution

4. Non-destructive determination of local strain with 100-nanometre spatial resolution

5. Application of an planar X-ray waveguide for structure study of thin film coatings

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2. Depth selective local coordination in CoFeB thin films probed by XAFS and ToF-SIMS;Journal of Alloys and Compounds;2023-10

3. Origin of exchange bias in [Co/Pt]ML/Fe multilayers with orthogonal magnetic anisotropies;Physical Review B;2023-08-14

4. Interface magnetism in Fe/Alq3 bilayer; interface resolved nuclear resonance scattering studies;Journal of Magnetism and Magnetic Materials;2022-10

5. Study of obliquely deposited 57Fe layer on organic semiconductor (Alq3); interface resolved magnetism under x-ray standing wave;Hyperfine Interactions;2021-11-06

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