1. Kim, J.H., Ahn, S., Jeon, J.W., Byun, J.E.: A High-speed High-resolution Vision System for the Inspection of TFT LCD. In: Proceedings. ISIE 2001. IEEE International Symposium, vol. 1, pp. 101–105 (2001)
2. Jain, R., Kasturi, R., Brain, G.S.: Machine Vision. McGraw Hill, New York (1995)
3. Oh, J.H., Kwak, D.H., Song, Y.C., Choi, D.H., Park, K.H.: Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Thresholding. In: 11th APCNDT, p. 61 (2003)