Author:
Giri Chandan,Sarkar Soumojit,Chattopadhyay Santanu
Publisher
Springer Berlin Heidelberg
Reference19 articles.
1. Marinissen, E.J., Goel, S.K., Lousberg, M.: Wrapper Design for Embedded Core Test. In: Proc. ITC, pp. 911–920 (2000)
2. Chakrabarty, K.: Test Scheduling for Core-Based Systems Using Mixed-Integer Linear Programming. In: IEEE TCAD, pp. 1163–1174 (2000)
3. Iyengar, V., Chakrabarty, K., Marinissen, E.J.: Test Wrapper and Test Access Mechanism Co-Optimization for System-On-Chip. Journal of Electronic Testing: Theory and Applications 18, 18 (2002)
4. Huang, Y., et al.: Resource Allocation and Test Scheduling for Concurrent Test of Core-Based SOC Design. In: proc. ATS, pp. 265–270 (2001)
5. Huang, Y., Reddy, S.M., Cheng, W.-T. ,Reuter, P.: Optimal Core Wrapper Width Selection and SOC Test Scheduling Based On 3D-bin Packing Algorithm. In: Proc. Intl. Test Conference(ITC) Baltimore, pp. 74–82 (2002)
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献