1. V. Adivarahan, M. Gaevski, W. Sun, H. Fatima, A. Kouymov, S. Saygi, G. Simin, J. Yang, M. Khan, A. Tarakji, M. Shur, R. Gaska, IEEE Electron Device Lett. 24, 541 (2003)
2. A. Agarwal, M. Das, B. Hull, S. Krishnaswami, J. Palmour, J. Richmond, S. Ryu, J. Zhang, in Device Research Conference, State College, PA, 2006, pp. 155–158
3. EMIS Data reviews Series;I. Akasaki,1994
4. EMIS Data reviews Series;I. Akasaki,1994
5. M. Akita, S. Kishimoto, K. Maezawa, T. Mizutani, Electron. Lett. 36, 1736 (2000)