Critical investigation of the secondary ion emission of pure metals using the pseudoatom method-Reference-Cited by-同舟云学术

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Critical investigation of the secondary ion emission of pure metals using the pseudoatom method

Published:1980-10 Issue:4 Volume:49 Page:351-360
ISSN:0001-6705
Container-title:Acta Physica Academiae Scientiarum Hungaricae
language:en
Short-container-title:Acta Physica

Author:

Antal J.,Kugler S.

Publisher

Springer Science and Business Media LLC

Subject

Nuclear and High Energy Physics

Link

http://link.springer.com/content/pdf/10.1007/BF03157401.pdf

Reference26 articles.

1. P. Joyes, Conf. on Ion-Surface Interactions, Garching, 1972, Gordon and Breach, London, p. 139, 1973.

2. G. Blaise, Conf. on Ion-Surface Interactions, Garching, 1972, Gordon and Breach, London, p. 147, 1973.

3. J. M. Schroeer, T. N. Rhodin andR. C. Bradley, Surf. Sci.,34, 571, 1973.

4. Z. Sroubek, Surf. Sci.,44, 47, 1974.

5. M. Cini, Surf. Sci.,54, 71, 1976.

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1. Further studies on the secondary ion emission of pure metals using the pseudo-atom method;Acta Physica Academiae Scientiarum Hungaricae;1981-05

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